"Advanced Defect Analysis With Self-Supervised Pretraining and Knowledge ..."

Jing-Ming Guo et al. (2025)

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DOI: 10.1109/MMUL.2025.3566274

access: closed

type: Journal Article

metadata version: 2025-11-09

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Jing-Ming Guo, Lun-Da Yuan, Cian Huang, Yi-Chong Zeng:
Advanced Defect Analysis With Self-Supervised Pretraining and Knowledge Distillation. IEEE Multim. 32(3): 15-26 (2025)

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