"Study on the single-event upset sensitivity of 65-nm CMOS sequential logic ..."

Sai Li et al. (2020)

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DOI: 10.1587/ELEX.17.20200102

access: open

type: Journal Article

metadata version: 2025-10-14

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  - https://dblp.org/rec/journals/ieiceee/LiHCSMW20
Sai Li, Jianwei Han, Rui Chen, Shipeng Shangguan, Yingqi Ma, Xuan Wang:
Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit. IEICE Electron. Express 17(10): 20200102 (2020)

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