"Effectiveness of the layout approach in mitigating single event transients ..."

Tiehu Li et al. (2018)

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DOI: 10.1587/ELEX.15.20180540

access: open

type: Journal Article

metadata version: 2025-01-19

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  - https://dblp.org/rec/journals/ieiceee/LiYLLZ18
Tiehu Li, Yintang Yang, Liang Li, Jia Liu, Junan Zhang:
Effectiveness of the layout approach in mitigating single event transients in 65-nm bulk CMOS process. IEICE Electron. Express 15(13): 20180540 (2018)

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