"A novel highly reliable and low-power radiation hardened SRAM bit-cell design."

Dianpeng Lin et al. (2018)

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DOI: 10.1587/ELEX.15.20171129

access: open

type: Journal Article

metadata version: 2023-01-17

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Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou:
A novel highly reliable and low-power radiation hardened SRAM bit-cell design. IEICE Electron. Express 15(3): 20171129 (2018)

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