"A novel methodology for speeding up IC performance in 32nm FinFET."

Hung Viet Nguyen, Myunghwan Ryu, Youngmin Kim (2012)

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DOI: 10.1587/ELEX.9.227

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/NguyenRK12
Hung Viet Nguyen, Myunghwan Ryu, Youngmin Kim:
A novel methodology for speeding up IC performance in 32nm FinFET. IEICE Electron. Express 9(4): 227-233 (2012)

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