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ORCID"Characterization of oxide trap density with the charge pumping technique ..."
Younghwan Son, Yoon Kim, Myounggon Kang (2017)
- Younghwan Son, Yoon Kim, Myounggon Kang:
Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide. IEICE Electron. Express 14(8): 20170141 (2017)
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