"ADC jitter estimation using a single frequency test without requiring ..."

Minshun Wu, Guican Chen, Degang Chen (2012)

> Home

Details and statistics

DOI: 10.1587/ELEX.9.1485

access: open

type: Journal Article

metadata version: 2022-07-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/WuCC12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/WuCC12
Minshun Wu, Guican Chen, Degang Chen:
ADC jitter estimation using a single frequency test without requiring coherent sampling. IEICE Electron. Express 9(18): 1485-1491 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.