"Design and verification of universal evaluation system for single event ..."

Liewei Xu et al. (2019)

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DOI: 10.1587/ELEX.16.20190196

access: open

type: Journal Article

metadata version: 2025-01-19

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Liewei Xu, Chang Cai, Tianqi Liu, Lingyun Ke, Jun Yu, Chang Wu:
Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits. IEICE Electron. Express 16(10): 20190196 (2019)

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