"Modeling attacks against device authentication using CMOS image sensor PUF."

Hiroshi Yamada et al. (2021)

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DOI: 10.1587/ELEX.18.20210058

access: open

type: Journal Article

metadata version: 2022-02-03

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  - https://dblp.org/rec/journals/ieiceee/YamadaOSF21
Hiroshi Yamada, Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino:
Modeling attacks against device authentication using CMOS image sensor PUF. IEICE Electron. Express 18(7): 20210058 (2021)

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