"A charge recycling stacked I/O in standard CMOS technology for wide TSV ..."

Takefumi Yoshikawa et al. (2020)

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DOI: 10.1587/ELEX.17.20200112

access: open

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/ieiceee/YoshikawaISMI20
Takefumi Yoshikawa, Tatsuya Iwata, Junji Shibazaki, Sho Muroga, Hiroaki Ikeda:
A charge recycling stacked I/O in standard CMOS technology for wide TSV data bus. IEICE Electron. Express 17(10): 20200112 (2020)

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