"A common-mode BIST technique for fully-differential sample-and-hold circuits."

Jun Yuan, Masayoshi Tachibana (2012)

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DOI: 10.1587/ELEX.9.1128

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/YuanT12
Jun Yuan, Masayoshi Tachibana:
A common-mode BIST technique for fully-differential sample-and-hold circuits. IEICE Electron. Express 9(13): 1128-1134 (2012)

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