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"NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme ..."
Nurul Ezaila Alias et al. (2013)
- Nurul Ezaila Alias, Anil Kumar, Takuya Saraya, Shinji Miyano, Toshiro Hiramoto:
NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM. IEICE Trans. Electron. 96-C(5): 620-623 (2013)
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