"Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress."

Jin-Ping Ao et al. (2008)

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DOI: 10.1093/IETELE/E91-C.7.1004

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type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/AoYOHO08
Jin-Ping Ao, Yuya Yamaoka, Masaya Okada, Cheng-Yu Hu, Yasuo Ohno:
Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress. IEICE Trans. Electron. 91-C(7): 1004-1008 (2008)

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