"On-Chip In-Place Measurements of Vth and Signal/Substrate ..."

Yoji Bando et al. (2012)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.E95.C.137

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/BandoTOTYSKMN12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/BandoTOTYSKMN12
Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata:
On-Chip In-Place Measurements of V_th and Signal/Substrate Response of Differential Pair Transistors. IEICE Trans. Electron. 95-C(1): 137-145 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.