"Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability."

Song Bian et al. (2016)

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DOI: 10.1587/TRANSFUN.E99.A.1400

access: closed

type: Journal Article

metadata version: 2024-06-17

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  - https://dblp.org/rec/journals/ieicet/BianSHS16
Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato:
Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(7): 1400-1409 (2016)

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