"Cumulative Differential Nonlinearity Testing of ADCs."

Hung-Kai Chen, Yingchieh Ho, Chauchin Su (2012)

> Home

Details and statistics

DOI: 10.1587/TRANSFUN.E95.A.1768

access: closed

type: Journal Article

metadata version: 2022-11-14

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/ChenHS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ChenHS12
Hung-Kai Chen, Yingchieh Ho, Chauchin Su:
Cumulative Differential Nonlinearity Testing of ADCs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 95-A(10): 1768-1775 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.