"Design of High-ESD Reliability in HV Power pLDMOS Transistors by the ..."

Shen-Li Chen, Yu-Ting Huang, Yi-Cih Wu (2017)

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DOI: 10.1587/TRANSELE.E100.C.446

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type: Journal Article

metadata version: 2020-04-11

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Shen-Li Chen, Yu-Ting Huang, Yi-Cih Wu:
Design of High-ESD Reliability in HV Power pLDMOS Transistors by the Drain-Side Isolated SCRs. IEICE Trans. Electron. 100-C(5): 446-452 (2017)

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