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"High Ruggedness Power MOSFET Design by a Self-Align p+ Process."
Feng-Tso Chien et al. (2005)
- Feng-Tso Chien, Ming-Hung Lai, Shih-Tzung Su, Kou-Way Tu, Ching-Ling Cheng:
High Ruggedness Power MOSFET Design by a Self-Align p+ Process. IEICE Trans. Electron. 88-C(4): 694-698 (2005)
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