"High Ruggedness Power MOSFET Design by a Self-Align p⁺ Process."

Feng-Tso Chien et al. (2005)

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DOI: 10.1093/IETELE/E88-C.4.694

access: closed

type: Journal Article

metadata version: 2020-04-11

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Feng-Tso Chien, Ming-Hung Lai, Shih-Tzung Su, Kou-Way Tu, Ching-Ling Cheng:
High Ruggedness Power MOSFET Design by a Self-Align p⁺ Process. IEICE Trans. Electron. 88-C(4): 694-698 (2005)

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