"An Effective Model of the Overshooting Effect for Multiple-Input Gates in ..."

Li Ding et al. (2014)

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DOI: 10.1587/TRANSFUN.E97.A.1059

access: closed

type: Journal Article

metadata version: 2020-04-11

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Li Ding, Zhangcai Huang, Atsushi Kurokawa, Jing Wang, Yasuaki Inoue:
An Effective Model of the Overshooting Effect for Multiple-Input Gates in Nanometer Technologies. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 97-A(5): 1059-1074 (2014)

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