"Effects of Rapid Thermal Annealing on Poly-Si TFT with Different Gate ..."

Ching-Lin Fan et al. (2010)

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DOI: 10.1587/TRANSELE.E93.C.151

access: closed

type: Journal Article

metadata version: 2020-04-11

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Ching-Lin Fan, Yi-Yan Lin, Yan-Hang Yang, Hung-Che Chen:
Effects of Rapid Thermal Annealing on Poly-Si TFT with Different Gate Oxide Thickness. IEICE Trans. Electron. 93-C(1): 151-153 (2010)

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