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"Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in ..."
Kiyoshi Furuya, Susumu Yamazaki, Masayuki Sato (1995)
- Kiyoshi Furuya, Susumu Yamazaki, Masayuki Sato:
Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. IEICE Trans. Inf. Syst. 78-D(7): 889-894 (1995)
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