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"Investigation of Time Evolution of Length of Break Arcs Occurring in a ..."

Kenshi Hamamoto, Junya Sekikawa (2019)

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DOI: 10.1587/TRANSELE.2018ECS6025

access: closed

type: Journal Article

metadata version: 2021-01-18

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/HamamotoS19
Kenshi Hamamoto, Junya Sekikawa:
Investigation of Time Evolution of Length of Break Arcs Occurring in a 48VDC/50-300A Resistive Circuit. IEICE Trans. Electron. 102-C(5): 424-427 (2019)

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