"A New Randomness Test Based on Linear Complexity Profile."

Kenji Hamano, Fumio Sato, Hirosuke Yamamoto (2009)

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DOI: 10.1587/TRANSFUN.E92.A.166

access: closed

type: Journal Article

metadata version: 2020-04-11

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Kenji Hamano, Fumio Sato, Hirosuke Yamamoto:
A New Randomness Test Based on Linear Complexity Profile. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(1): 166-172 (2009)

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