"A Randomness Test Based on T-Complexity."

Kenji Hamano, Hirosuke Yamamoto (2010)

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DOI: 10.1587/TRANSFUN.E93.A.1346

access: closed

type: Journal Article

metadata version: 2020-04-11

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Kenji Hamano, Hirosuke Yamamoto:
A Randomness Test Based on T-Complexity. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(7): 1346-1354 (2010)

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