"Generation of Test Sequences with Low Power Dissipation for Sequential ..."

Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu (2004)

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type: Journal Article

metadata version: 2020-04-11

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Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu:
Generation of Test Sequences with Low Power Dissipation for Sequential Circuits. IEICE Trans. Inf. Syst. 87-D(3): 530-536 (2004)

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