"Analysis of Effective Material Properties of Metal Dummy Fills in a CMOS Chip."

Takuichi Hirano, Ning Li, Kenichi Okada (2017)

> Home

Details and statistics

DOI: 10.1587/TRANSCOM.2016EBT0004

access: closed

type: Journal Article

metadata version: 2025-02-26

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/HiranoLO17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/HiranoLO17
Takuichi Hirano, Ning Li, Kenichi Okada:
Analysis of Effective Material Properties of Metal Dummy Fills in a CMOS Chip. IEICE Trans. Commun. 100-B(5): 793-798 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.