"Buffer Layer Doping Concentration Measurement Using ..."

Cheng-Yu Hu et al. (2010)

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DOI: 10.1587/TRANSELE.E93.C.1234

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HuNKAO10
Cheng-Yu Hu, Katsutoshi Nakatani, Hiroji Kawai, Jin-Ping Ao, Yasuo Ohno:
Buffer Layer Doping Concentration Measurement Using V_T-V_SUB Characteristics of GaN HEMT with p-GaN Substrate Layer. IEICE Trans. Electron. 93-C(8): 1234-1237 (2010)

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