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"Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit ..."
Kouji Ichikawa et al. (2008)
- Kouji Ichikawa, Yuki Takahashi, Yukihiko Sakurai, Takahiro Tsuda, Isao Iwase, Makoto Nagata
:
Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation. IEICE Trans. Electron. 91-C(6): 936-944 (2008)

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