"Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit ..."

Kouji Ichikawa et al. (2008)

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DOI: 10.1093/IETELE/E91-C.6.936

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type: Journal Article

metadata version: 2020-04-11

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Kouji Ichikawa, Yuki Takahashi, Yukihiko Sakurai, Takahiro Tsuda, Isao Iwase, Makoto Nagata:
Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation. IEICE Trans. Electron. 91-C(6): 936-944 (2008)

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