"All-Digital On-Chip Monitor for PMOS and NMOS Process Variability ..."

Tetsuya Iizuka et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.487

access: closed

type: Journal Article

metadata version: 2020-04-11

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Tetsuya Iizuka, Jaehyun Jeong, Toru Nakura, Makoto Ikeda, Kunihiro Asada:
All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter. IEICE Trans. Electron. 94-C(4): 487-494 (2011)

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