"Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors ..."

Yoshioki Isobe et al. (2007)

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DOI: 10.1093/IETELE/E90-C.4.885

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type: Journal Article

metadata version: 2020-04-11

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Yoshioki Isobe, Kiyohito Hara, Dondee Navarro, Youichi Takeda, Tatsuya Ezaki, Mitiko Miura-Mattausch:
Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition. IEICE Trans. Electron. 90-C(4): 885-894 (2007)

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