"Micro-Structural Study of Fretting Contact Caused by the Difference of the ..."

Tetsuya Ito et al. (2008)

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DOI: 10.1093/IETELE/E91-C.8.1199

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/ItoSHSTI08
Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida:
Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness. IEICE Trans. Electron. 91-C(8): 1199-1205 (2008)

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