"Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through ..."

Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko (2011)

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DOI: 10.1587/TRANSFUN.E94.A.2563

access: closed

type: Journal Article

metadata version: 2020-04-11

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Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko:
Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through Special Data Transfer. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(12): 2563-2570 (2011)

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