"Interface State Density between Direct Nitridation Layer and SiC Estimated ..."

Kiichi Kamimura et al. (2009)

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DOI: 10.1587/TRANSELE.E92.C.1470

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/KamimuraSYH09
Kiichi Kamimura, Hiroaki Shiozawa, Tomohiko Yamakami, Rinpei Hayashibe:
Interface State Density between Direct Nitridation Layer and SiC Estimated from Current Voltage Characteristics of MIS Schottky Diode. IEICE Trans. Electron. 92-C(12): 1470-1474 (2009)

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