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"Potential of Fault-Detection Coverage by means of On-Chip Redundancy - ..."
Nobuyasu Kanekawa (2013)
- Nobuyasu Kanekawa:
Potential of Fault-Detection Coverage by means of On-Chip Redundancy - IEC61508: Are There Royal Roads to SIL 4? IEICE Trans. Inf. Syst. 96-D(9): 1907-1913 (2013)
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