"A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters."

Kicheol Kim et al. (2008)

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DOI: 10.1093/IETELE/E91-C.4.670

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type: Journal Article

metadata version: 2024-07-15

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Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Trans. Electron. 91-C(4): 670-672 (2008)

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