default search action
"Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit ..."
Doo-Hyun Kim et al. (2009)
- Doo-Hyun Kim, Il-Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park:
Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Trans. Electron. 92-C(5): 659-663 (2009)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.