"A New Low Power Test Pattern Generator for BIST Architecture."

Kicheol Kim et al. (2005)

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DOI: 10.1093/IETELE/E88-C.10.2037

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type: Journal Article

metadata version: 2020-04-11

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Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang:
A New Low Power Test Pattern Generator for BIST Architecture. IEICE Trans. Electron. 88-C(10): 2037-2038 (2005)

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