"Numerical Modeling; Thickness Dependence of J-V Characteristic for ..."

Sang-Gun Lee et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.1756

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/LeeCHLTA12
Sang-Gun Lee, Hong-Seok Choi, Chang-Wook Han, Seok-Jong Lee, Yoon-Heung Tak, Byung-Chul Ahn:
Numerical Modeling; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device. IEICE Trans. Electron. 95-C(11): 1756-1760 (2012)

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