"Accurate Extraction of the Trap Depth from RTS Noise Data by Including ..."

Hochul Lee et al. (2007)

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DOI: 10.1093/IETELE/E90-C.5.968

access: closed

type: Journal Article

metadata version: 2020-04-11

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Hochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin:
Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Trans. Electron. 90-C(5): 968-972 (2007)

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