"Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an ..."

Dong-Seup Lee et al. (2010)

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DOI: 10.1587/TRANSELE.E93.C.540

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/LeeYKLLCP10
Dong-Seup Lee, Hong-Seon Yang, Kwon-Chil Kang, Joung-Eob Lee, Jung Han Lee, Seongjae Cho, Byung-Gook Park:
Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an n-Doped Layer. IEICE Trans. Electron. 93-C(5): 540-545 (2010)

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