"Maximal Interconnect Resilient Methodology for Fault Tolerance, Yield, and ..."

Katherine Shu-Min Li, Chih-Yun Pai, Liang-Bi Chen (2011)

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DOI: 10.1587/TRANSFUN.E94.A.2649

access: closed

type: Journal Article

metadata version: 2020-04-11

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Katherine Shu-Min Li, Chih-Yun Pai, Liang-Bi Chen:
Maximal Interconnect Resilient Methodology for Fault Tolerance, Yield, and Reliability Improvement in Network on Chip. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(12): 2649-2658 (2011)

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