"A Single Input Change Test Pattern Generator for Sequential Circuits."

Feng Liang, Shaochong Lei, Zhibiao Shao (2008)

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DOI: 10.1093/IETELE/E91-C.8.1365

access: closed

type: Journal Article

metadata version: 2021-08-31

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Feng Liang, Shaochong Lei, Zhibiao Shao:
A Single Input Change Test Pattern Generator for Sequential Circuits. IEICE Trans. Electron. 91-C(8): 1365-1370 (2008)

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