"A Test Structure for Asymmetry and Orientation Dependence Analysis of ..."

Toshihiro Matsuda et al. (2008)

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DOI: 10.1093/IETELE/E91-C.8.1331

access: closed

type: Journal Article

metadata version: 2020-04-11

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Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku:
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs. IEICE Trans. Electron. 91-C(8): 1331-1337 (2008)

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