"A Test Structure for Two-Dimensional Analysis of MOSFETs by ..."

Toshihiro Matsuda et al. (2005)

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DOI: 10.1093/IETELE/E88-C.5.811

access: closed

type: Journal Article

metadata version: 2020-04-11

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Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma:
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Trans. Electron. 88-C(5): 811-816 (2005)

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