"Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair."

Gian Mayuga et al. (2016)

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DOI: 10.1587/TRANSINF.2015EDP7408

access: closed

type: Journal Article

metadata version: 2020-04-11

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Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue:
Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair. IEICE Trans. Inf. Syst. 99-D(10): 2591-2599 (2016)

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