"Determining GaInP/GaAs HBT Device Structure by DC Measurements on a ..."

Chinchun Meng, Bo-Chen Tsou, Sheng-Che Tseng (2005)

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DOI: 10.1093/IETELE/E88-C.6.1127

access: closed

type: Journal Article

metadata version: 2020-04-11

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Chinchun Meng, Bo-Chen Tsou, Sheng-Che Tseng:
Determining GaInP/GaAs HBT Device Structure by DC Measurements on a Two-Emitter HBT Device and High Frequency Transit Time Measurements. IEICE Trans. Electron. 88-C(6): 1127-1132 (2005)

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