"Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip."

Ryo Minami et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.1057

access: closed

type: Journal Article

metadata version: 2025-02-26

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  - https://dblp.org/rec/journals/ieicet/MinamiHOM11
Ryo Minami, Jee Young Hong, Kenichi Okada, Akira Matsuzawa:
Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip. IEICE Trans. Electron. 94-C(6): 1057-1060 (2011)

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