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"On Detection of Bridge Defects with Stuck-at Tests."

Kohei Miyase et al. (2008)

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DOI: 10.1093/IETISY/E91-D.3.683

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/MiyaseTWKR08
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  - https://dblp.org/rec/journals/ieicet/MiyaseTWKR08
Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy:
On Detection of Bridge Defects with Stuck-at Tests. IEICE Trans. Inf. Syst. 91-D(3): 683-689 (2008)

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