"High Launch Switching Activity Reduction in At-Speed Scan Testing Using ..."

Kohei Miyase et al. (2010)

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DOI: 10.1587/TRANSINF.E93.D.2

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/MiyaseWFYKGWT10
Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor:
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Trans. Inf. Syst. 93-D(1): 2-9 (2010)

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