"Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation."

Kazuteru Namba, Hideo Ito (2005)

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DOI: 10.1093/IETISY/E88-D.9.2135

access: closed

type: Journal Article

metadata version: 2020-04-11

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Kazuteru Namba, Hideo Ito:
Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation. IEICE Trans. Inf. Syst. 88-D(9): 2135-2142 (2005)

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